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RUGOSURF 20
Article no.: 2088391
Catalog no.: L41150 96
Article code:
Please note the delivery time and limited advice:
We order this item for you directly from the manufacturer, as it is not part of our main range and is therefore not in stock with us.
InfoProduct details
Technical Data
| Type of product | Surface roughness measuring instrument |
Identification & Classification
| Article number | 2088391 | |
| Catalog number | L41150 96 | |
| EAN / GTIN | 7630041118018 | |
| Manufacturer number | 06930013 |
Description
Version:
- Résolution [µm]: 0.001
- Résolution [µ-in]: .01
Description:
RUGOSURF 20
TESA RUGOSURF 20 portable surface roughness tester for use in the workshop. Z = ± 200 μm (± 0.0079 in) X = 16 mm (0.63 in)
TESA RUGOSURF 20 portable surface roughness tester for use in the workshop. Z = ± 200 μm (± 0.0079 in) X = 16 mm (0.63 in)
Feature:
- Measuring range: Z: ±200 µm; X: 16 mm
- Range of indication: Ra = 0 ÷ 100 μm; Rt = 0,05 ÷ 400 μm
- Max. permitted errors: R = roughness in μm; 0,05 μm + (5% R)
- Material: Stylus tip: diamond
- Dimensions: Housing: 122 x 60 x 62 mm; Screen: 160 x 100 pixels; Tip: R2 μm, 90°
- Degree of protection: Keyboard: IP67
- Display: LCD, black/white
- Data output(s): Micro-USB
- Measuring force: 0,75 mN
- Units: mm / in
- Roughness parameters: Available with the RUGOSURF 20 used in conjunction with the following TESA DATA-STUDIO versions:
- Basic version: According to ISO 4287: Ra, Rq, Rt, Rz, Rc, Rmax, RSm, RPc; According to ISO 12085: Pt, R, AR, Rx, PPc
- Premium version: According to ISO 12085: Rke, Rpke, Rvke, A1e, A2e, Mr1e, Mr2e; According to ISO 4287: Rp, Rv, Rsk, Rku, RΔq, RΔa, Rmr rel, Rδc, Rmr(c); Pa, Pq, Pp, Pv, Pt, Pc, RPc, R3z; Psk, Pku, PSm, PΔq, Pmr rel, Pδc, Pmr(c); Rk, Rpk, Rvk, A1, A2, Mr1, Mr2; as well as all parameters of the basic version
- Graphic(s): With DATA-STUDIO version: Basic: R-profile; Premium: P-profile, Rk-profile
- Cut-off: Number: 1 - 5; Lengths: 0,25 - 0,8 - 2,5 mm (ISO 4287); 1,5 - 2,5 - 4 - 8 - 12 - 16 mm (ISO 12085)
- Memory: Measurements with parameters: < 1'000; Measurements with profile and graph: < 20
- Probe displacement speed: 1 mm/s
- Delay before measurement: 4 to 10 s
Standard:
ISO 3274, ISO 4287, ISO 12085, ISO 21920